VLSI test principles and architectures design for testability
by
 
Wang, Laung-Terng.

Title
: 
VLSI test principles and architectures design for testability

Author
: 
Wang, Laung-Terng.

ISBN
: 
9780080474793

Publication Information
: 
Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006.

Physical Description
: 
1 online resource (xxx, 777 p.) : ill.

Series
: 
The Morgan Kaufmann series in systems on silicon

Series Title
: 
The Morgan Kaufmann series in systems on silicon

Subject Term
: 
Integrated circuits -- Very large scale integration -- Testing.
 
Integrated circuits -- Very large scale integration -- Design.
 
Testen.
 
VLSI.

Added Author
: 
Wang, Laung-Terng.
 
Wu, Cheng-Wen, EE Ph. D.
 
Wen, Xiaoqing.

Electronic Access
: 
ScienceDirect http://www.sciencedirect.com/science/book/9780123705976


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book253779-1001ONLINEElektronik Kütüphane