Electronics reliability and measurement technology nondestructive evaluation
by
 
Heyman, Joseph S.

Title
: 
Electronics reliability and measurement technology nondestructive evaluation

Author
: 
Heyman, Joseph S.

ISBN
: 
9781591240518
 
9780815511717
 
9780815516996

Publication Information
: 
Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.

Physical Description
: 
1 online resource (xii, 128 pages) : illustrations

Subject Term
: 
Integrated circuits -- Reliability -- Congresses.
 
Nondestructive testing -- Congresses.
 
Integrated circuits -- Testing -- Congresses.

Added Author
: 
Heyman, Joseph S.

Electronic Access
: 
ScienceDirect http://www.sciencedirect.com/science/book/9780815511717


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book254151-1001ONLINEElektronik Kütüphane