Computed electron micrographs and defect identification
by
 
Head, A. K.

Title
: 
Computed electron micrographs and defect identification

Author
: 
Head, A. K.

ISBN
: 
9780720417579
 
9780444601476

Publication Information
: 
Amsterdam, North-Holland Pub. Co., 1973.

Physical Description
: 
1 online resource (x, 400 p. with illus.)

Series
: 
Defects in crystalline solids, v. 7

Series Title
: 
Defects in crystalline solids, v. 7

Subject Term
: 
Metals -- Defects -- Data processing.
 
Electron microscopy -- Data processing.
 
physique.
 
identification défaut.
 
cristallographie.
 
dislocation.
 
diffraction.
 
Metall.
 
Mikrostruktur.

Added Author
: 
Head, A. K.

Electronic Access
: 
ScienceDirect http://www.sciencedirect.com/science/book/9780720417579


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book256160-1001ONLINEElektronik Kütüphane