Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
by
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan)
Title
:
Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2
Author
:
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan)
ISBN
:
9780444884299
Conference Author
:
International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan)
Publication Information
:
Amsterdam ; New York : North-Holland ; New York, N.Y., U.S.A. : Distributors for the U.S. and Canada, Elsevier Science Pub. Co., 1990.
Physical Description
:
1 online resource : ill.
Subject Term
:
Semiconductors -- Defects -- Congresses.
Materials -- Defects -- Congresses.
Added Author
:
Sumino, K. (Kōji), 1931-
Electronic Access
:
| Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
|---|
| Online Library | E-Book | 256277-1001 | ONLINE | | Elektronik Kütüphane |