Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
by
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)
Title
:
Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan
Author
:
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)
ISBN
:
9783038138563
Conference Author
:
International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)
Publication Information
:
Durnten-Zurich ; Enfield, N.H. : Trans Tech Publications, c2012.
Physical Description
:
1 online resource (xiii, 299 p.) : ill.
Series
:
Materials science forum, v. 725
Series Title
:
Materials science forum, 0255-5476 ; v. 725
Subject Term
:
Semiconductors -- Defects -- Congresses.
Image processing -- Congresses.
Added Author
:
Yamada-Kaneta, Hiroshi.
Sakai, Akira.
Electronic Access
:
| Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
|---|
| Online Library | E-Book | 279616-1001 | ONLINE | | Elektronik Kütüphane |