Characterization in silicon processing
by
 
Strausser, Yale.

Title
: 
Characterization in silicon processing

Author
: 
Strausser, Yale.

ISBN
: 
9781606501115
 
9781606501092

Publication Information
: 
New York, NY : Momentum Press, 2010.

Physical Description
: 
1 online resource (xv, 240 p.) : ill.

Series
: 
Materials characterization series

Series Title
: 
Materials characterization series

Subject Term
: 
Silicon.
 
Electric conductors.
 
Semiconductor films.
 
Surface chemistry.

Added Author
: 
Strausser, Yale.
 
Brundle, C. Richard.
 
Evans, Charles A.

Electronic Access
: 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=501143


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book280190-1001ONLINEElektronik Kütüphane