Semiconductor strain metrology principles and applications
by
 
Wong, Terence K. S.

Title
: 
Semiconductor strain metrology principles and applications

Author
: 
Wong, Terence K. S.

ISBN
: 
9781608053599

Publication Information
: 
[Saif Zone, Sharjah, U.A.E] ; Oak Park, IL : Bentham Science, [2012]

Physical Description
: 
1 online resource (136 p. :) ill.

Subject Term
: 
Semiconductors -- Design and construction -- Materials.
 
Compound semiconductors -- Design and construction -- Materials.
 
Silicon-on-insulator technology.

Electronic Access
: 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book280205-1001ONLINEElektronik Kütüphane