RF and microwave modeling and measurement techniques for field effect transistors
by
 
Gao, Jianjun, 1968-

Title
: 
RF and microwave modeling and measurement techniques for field effect transistors

Author
: 
Gao, Jianjun, 1968-

ISBN
: 
9781613442869
 
9781613530900

Publication Information
: 
Raleigh, NC : SciTech Pub., c2010.

Physical Description
: 
1 online resource (x, 339 p.) : ill.

Subject Term
: 
Field-effect transistors -- Testing.
 
Compound semiconductors -- Testing.
 
Field-effect transistors -- Mathematical models.
 
Compound semiconductors -- Mathematical models.
 
Microwave measurements.
 
Radio measurements.

Added Corporate Author
: 
Knovel (Firm)

Electronic Access
: 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book280925-1001ONLINEElektronik Kütüphane