Measurement and modeling of silicon heterostructure devices
by
Cressler, John D.
Title
:
Measurement and modeling of silicon heterostructure devices
Author
:
Cressler, John D.
ISBN
:
9781420066937
Publication Information
:
Boca Raton, FL : CRC Press, c2008.
Physical Description
:
200 p. : ill.
Subject Term
:
Bipolar transistors -- Mathematical models.
Bipolar transistors.
Heterostructures.
Integrated circuits -- Design and construction.
Added Author
:
Cressler, John D.
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 285989-1001 | ONLINE | | Elektronik Kütüphane |