Measurement and modeling of silicon heterostructure devices
by
 
Cressler, John D.

Title
: 
Measurement and modeling of silicon heterostructure devices

Author
: 
Cressler, John D.

ISBN
: 
9781420066937

Publication Information
: 
Boca Raton, FL : CRC Press, c2008.

Physical Description
: 
200 p. : ill.

Subject Term
: 
Bipolar transistors -- Mathematical models.
 
Bipolar transistors.
 
Heterostructures.
 
Integrated circuits -- Design and construction.

Added Author
: 
Cressler, John D.

Electronic Access
: 
Distributed by publisher. Purchase or institutional license may be required for access.


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book285989-1001ONLINEElektronik Kütüphane