Testing complex and embedded systems
by
 
Pries, Kim H., 1955-

Title
Testing complex and embedded systems

Author
Pries, Kim H., 1955-

ISBN
9781439821411

Publication Information
Boca Raton, Fla. : CRC Press, 2011.

Physical Description
xxxi, 287 p. : ill.

Contents
1. Does your testing look like this? -- 2. Benefits of improved testing -- 3. Overview -- 4. Basic principles -- 5. The question -- 6. Contradictory perspectives of testing -- 7. The use of noise -- 8. How to perform 'bad' tests -- 9. Documenting the testing -- 10. Test administration -- 11. Advanced concepts -- 12. Software test documentation -- 13. Configuration management -- 14. Software testing -- 15. Systems testing -- 16. Simulation and emulation -- 17. Span of tests -- 18. Exit criteria.

Abstract
"Using combinatorial approaches, this book aims to motivate testers and testing organizations to perform meaningful testing. The text details planning activities prior to testing, how to scope the work, and how to achieve a successful conclusion. Rather than presenting the entire continuum of testing for a particular product or design attribute, this volume focuses on boundary conditions. The authors provide various techniques that can be used to streamline testing and help identify problems before they occur, including turbocharge testing methods from Six Sigma. Coverage includes testing, simulation, and emulation"-- Provided by publisher.

Subject Term
Embedded computer systems -- Testing.

Added Author
Quigley, Jon M.

Electronic Access
Distributed by publisher. Purchase or institutional license may be required for access.


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book288873-1001ONLINEElektronik Kütüphane