Semiconductor process reliability in practice
by
 
Gan, Zhenghao.

Title
: 
Semiconductor process reliability in practice

Author
: 
Gan, Zhenghao.

ISBN
: 
9780071754286

Publication Information
: 
New York : McGraw Hill Professional, [2012]

Physical Description
: 
1 electronic text (xv, 605 p. : ill.) : PDF file.

Series
: 
McGraw Hill ebook library. Engineering and computing, Electrical and electronics

Series Title
: 
McGraw Hill ebook library. Engineering and computing, Electrical and electronics

Subject Term
: 
Semiconductors -- Reliability.
 
Semiconductors -- Materials.
 
Metal oxide semiconductors -- Reliability.
 
Integrated circuits -- Reliability.

Added Author
: 
Wong, Waisum.
 
Liou, Juin J.

Electronic Access
: 
Subscription required


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book293479-1001ONLINEElektronik Kütüphane