Accelerated testing statistical models, test plans and data analyses
by
 
Nelson, Wayne, 1936-

Title
: 
Accelerated testing statistical models, test plans and data analyses

Author
: 
Nelson, Wayne, 1936-

ISBN
: 
9780470317471
 
9780470316795

Publication Information
: 
New York : Wiley, c1990.

Physical Description
: 
1 online resource (xiv, 601 p.) : ill.

Series
: 
Wiley series in probability and mathematical statistics. Applied probability and statistics

Series Title
: 
Wiley series in probability and mathematical statistics. Applied probability and statistics

Subject Term
: 
Failure time data analysis.
 
Reliability (Engineering) -- Statistical methods.
 
Accelerated life testing -- Statistical methods.

Electronic Access
: 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757
 
John Wiley http://dx.doi.org/10.1002/9780470316795
 
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley047/89024853.html
 
HathiTrust Digital Library Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/20454343.html


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book295259-1001ONLINEElektronik Kütüphane