Thin film analysis by X-ray scattering
by
Birkholz, Mario.
Title
:
Thin film analysis by X-ray scattering
Author
:
Birkholz, Mario.
ISBN
:
9783527310524
9783527607594
Publication Information
:
Weinheim : Wiley-VCH, c2006.
Physical Description
:
xxii, 356 p. : ill. ; 25 cm.
Subject Term
:
Thin films.
X-ray spectroscopy.
Added Author
:
Fewster, Paul F.
Genzel, Christoph.
Added Corporate Author
:
John Wiley & Sons.
Electronic Access
:
| Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
|---|
| Online Library | E-Book | 302207-1001 | ONLINE | | Elektronik Kütüphane |