Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
by
Abu-Rahma, Mohamed H. author.
Title
:
Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
Author
:
Abu-Rahma, Mohamed H. author.
ISBN
:
9781461417491
Physical Description
:
XVI, 172 p. online resource.
Subject Term
:
Engineering.
Computer aided design.
Systems engineering.
Circuits and Systems.
Computer-Aided Engineering (CAD, CAE) and Design.
Added Author
:
Anis, Mohab.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 331282-1001 | ONLINE(331282.1) | | Elektronik Kütüphane |