Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield
by
 
Abu-Rahma, Mohamed H. author.

Title
: 
Nanometer Variation-Tolerant SRAM Circuits and Statistical Design for Yield

Author
: 
Abu-Rahma, Mohamed H. author.

ISBN
: 
9781461417491

Physical Description
: 
XVI, 172 p. online resource.

Subject Term
: 
Engineering.
 
Computer aided design.
 
Systems engineering.
 
Circuits and Systems.
 
Computer-Aided Engineering (CAD, CAE) and Design.

Added Author
: 
Anis, Mohab.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-1-4614-1749-1


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book331282-1001ONLINE(331282.1)Elektronik Kütüphane