Analog IC Reliability in Nanometer CMOS
by
 
Maricau, Elie. author.

Title
: 
Analog IC Reliability in Nanometer CMOS

Author
: 
Maricau, Elie. author.

ISBN
: 
9781461461630

Physical Description
: 
XVI, 198 p. 95 illus., 27 illus. in color. online resource.

Series
: 
Analog Circuits and Signal Processing

Subject Term
: 
Engineering.
 
Electronics.
 
Systems engineering.
 
Circuits and Systems.
 
Electronics and Microelectronics, Instrumentation.
 
Nanotechnology and Microengineering.

Added Author
: 
Gielen, Georges.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-1-4614-6163-0


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book331961-1001ONLINE(331961.1)Elektronik Kütüphane