Analog IC Reliability in Nanometer CMOS
by
Maricau, Elie. author.
Title
:
Analog IC Reliability in Nanometer CMOS
Author
:
Maricau, Elie. author.
ISBN
:
9781461461630
Physical Description
:
XVI, 198 p. 95 illus., 27 illus. in color. online resource.
Series
:
Analog Circuits and Signal Processing
Subject Term
:
Engineering.
Electronics.
Systems engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Nanotechnology and Microengineering.
Added Author
:
Gielen, Georges.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 331961-1001 | ONLINE(331961.1) | | Elektronik Kütüphane |