Helium Ion Microscopy Principles and Applications
by
Joy, David C. author.
Title
:
Helium Ion Microscopy Principles and Applications
Author
:
Joy, David C. author.
ISBN
:
9781461486602
Physical Description
:
VIII, 64 p. 29 illus., 16 illus. in color. online resource.
Series
:
SpringerBriefs in Materials,
Subject Term
:
Spectroscopy.
Nanotechnology.
Surfaces (Physics).
Materials Science.
Characterization and Evaluation of Materials.
Spectroscopy and Microscopy.
Spectroscopy/Spectrometry.
Nanoscale Science and Technology.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 332438-1001 | ONLINE(332438.1) | | Elektronik Kütüphane |