Helium Ion Microscopy Principles and Applications
by
 
Joy, David C. author.

Title
: 
Helium Ion Microscopy Principles and Applications

Author
: 
Joy, David C. author.

ISBN
: 
9781461486602

Physical Description
: 
VIII, 64 p. 29 illus., 16 illus. in color. online resource.

Series
: 
SpringerBriefs in Materials,

Subject Term
: 
Spectroscopy.
 
Nanotechnology.
 
Surfaces (Physics).
 
Materials Science.
 
Characterization and Evaluation of Materials.
 
Spectroscopy and Microscopy.
 
Spectroscopy/Spectrometry.
 
Nanoscale Science and Technology.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-1-4614-8660-2


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book332438-1001ONLINE(332438.1)Elektronik Kütüphane