Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
by
 
van Schooten, Kipp. author.

Title
: 
Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance

Author
: 
van Schooten, Kipp. author.

ISBN
: 
9783319005904

Physical Description
: 
XIV, 90 p. 28 illus. in color. online resource.

Series
: 
Springer Theses, Recognizing Outstanding Ph.D. Research,

Subject Term
: 
Physics.
 
Engineering.
 
Nanotechnology.
 
Semiconductors.
 
Spectroscopy and Microscopy.
 
Nanoscale Science and Technology.
 
Nanotechnology and Microengineering.
 
Quantum Information Technology, Spintronics.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-3-319-00590-4


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book332776-1001ONLINE(332776.1)Elektronik Kütüphane