Ellipsometry at the Nanoscale
by
 
Losurdo, Maria. editor.

Title
: 
Ellipsometry at the Nanoscale

Author
: 
Losurdo, Maria. editor.

ISBN
: 
9783642339561

Physical Description
: 
XXIV, 730 p. 423 illus., 106 illus. in color. online resource.

Subject Term
: 
Engineering.
 
Nanotechnology.
 
Surfaces (Physics).
 
Nanotechnology and Microengineering.
 
Measurement Science and Instrumentation.
 
Characterization and Evaluation of Materials.

Added Author
: 
Hingerl, Kurt.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-3-642-33956-1


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book333782-1001ONLINE(333782.1)Elektronik Kütüphane