Ellipsometry at the Nanoscale
by
Losurdo, Maria. editor.
Title
:
Ellipsometry at the Nanoscale
Author
:
Losurdo, Maria. editor.
ISBN
:
9783642339561
Physical Description
:
XXIV, 730 p. 423 illus., 106 illus. in color. online resource.
Subject Term
:
Engineering.
Nanotechnology.
Surfaces (Physics).
Nanotechnology and Microengineering.
Measurement Science and Instrumentation.
Characterization and Evaluation of Materials.
Added Author
:
Hingerl, Kurt.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 333782-1001 | ONLINE(333782.1) | | Elektronik Kütüphane |