Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
by
Im, Seongil. author.
Title
:
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
Author
:
Im, Seongil. author.
ISBN
:
9789400763920
Physical Description
:
XI, 101 p. 61 illus. online resource.
Series
:
SpringerBriefs in Physics,
Subject Term
:
Physics.
Systems engineering.
Electronic Circuits and Devices.
Solid State Physics.
Circuits and Systems.
Optics, Optoelectronics, Plasmonics and Optical Devices.
Measurement Science and Instrumentation.
Added Author
:
Chang, Youn-Gyoung.
Kim, Jae Hoon.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 336233-1001 | ONLINE(336233.1) | | Elektronik Kütüphane |