Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
by
 
Im, Seongil. author.

Title
: 
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors

Author
: 
Im, Seongil. author.

ISBN
: 
9789400763920

Physical Description
: 
XI, 101 p. 61 illus. online resource.

Series
: 
SpringerBriefs in Physics,

Subject Term
: 
Physics.
 
Systems engineering.
 
Electronic Circuits and Devices.
 
Solid State Physics.
 
Circuits and Systems.
 
Optics, Optoelectronics, Plasmonics and Optical Devices.
 
Measurement Science and Instrumentation.

Added Author
: 
Chang, Youn-Gyoung.
 
Kim, Jae Hoon.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-94-007-6392-0


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book336233-1001ONLINE(336233.1)Elektronik Kütüphane