Electromigration Modeling at Circuit Layout Level
by
 
Tan, Cher Ming. author.

Title
: 
Electromigration Modeling at Circuit Layout Level

Author
: 
Tan, Cher Ming. author.

ISBN
: 
9789814451215

Physical Description
: 
IX, 103 p. 75 illus., 2 illus. in color. online resource.

Series
: 
SpringerBriefs in Applied Sciences and Technology,

Subject Term
: 
Engineering.
 
System safety.
 
Quality Control, Reliability, Safety and Risk.
 
Electronic Circuits and Devices.
 
Atomic, Molecular, Optical and Plasma Physics.

Added Author
: 
He, Feifei.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
http://dx.doi.org/10.1007/978-981-4451-21-5


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book336507-1001ONLINE(336507.1)Elektronik Kütüphane