Testing for small-delay defects in nanoscale CMOS integrated circuits
by
 
Goel, Sandeep K, editor of compilation.

Title
: 
Testing for small-delay defects in nanoscale CMOS integrated circuits

Author
: 
Goel, Sandeep K, editor of compilation.

ISBN
: 
9781439829424

Physical Description
: 
1 online resource : text file, PDF

Series
: 
Devices, circuits, and systems
 
Devices, circuits, and systems.

Subject Term
: 
Metal oxide semiconductors, Complementary -- Testing.

Added Author
: 
Goel, Sandeep K,
 
Chakrabarty, Krishnendu,

Electronic Access
: 
Distributed by publisher. Purchase or institutional license may be required for access.


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book342881-1001ONLINE(342881.1)Elektronik Kütüphane