Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
by
 
Bushnell, Michael L. (Michael Lee), 1950-

Title
: 
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Author
: 
Bushnell, Michael L. (Michael Lee), 1950-

ISBN
: 
9780792379911

Publication Information
: 
Boston : Kluwer Academic, 2000.

Physical Description
: 
xviii, 690 s.

Series
: 
Frontiers in electronic testing ; 17

Subject Term
: 
İntegre Devreler -- Çok geniş kapsamlı integre devreler -- Test.
 
Integrated circuits -- Very large scale integration -- Testing.
 
Dijital entegre devreler -- Test.
 
Digital integrated circuits -- Testing.

Added Author
: 
Agrawal, Vishwani D., 1943-


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Beytepe LibraryBook7.2/19/3831TK7874.75 B87 2000Beytepe Genel Koleksiyon