Testing static random access memories : Defects, fault models, and test patterns
by
 
Hamdioui, Said.

Title
: 
Testing static random access memories : Defects, fault models, and test patterns

Author
: 
Hamdioui, Said.

ISBN
: 
9781402077524

Publication Information
: 
Boston : Kluwer Academic, 2004.

Physical Description
: 
xx, 221 s.

Series
: 
Frontiers in electronic testing

Subject Term
: 
Random access memory -- Testing.
 
Rastgele erişimli bellek -- Deneme.


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Beytepe LibraryBook7.2/19/3834TK7895.M4 H34 2004Beytepe Genel Koleksiyon