Contactless VLSI Measurement and Testing Techniques
by
 
Sayil, Selahattin. author.

Title
: 
Contactless VLSI Measurement and Testing Techniques

Author
: 
Sayil, Selahattin. author.

ISBN
: 
9783319696737

Edition
: 
1st ed. 2018.

Physical Description
: 
V, 93 p. 34 illus., 11 illus. in color. online resource.

Subject Term
: 
Systems engineering.
 
Computer science.
 
Electronics.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
https://doi.org/10.1007/978-3-319-69673-7


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book401142-1001ONLINEElektronik Kütüphane