Computed electron micrographs and defect identification
by
 
Head, A. K.

Title
: 
Computed electron micrographs and defect identification

Author
: 
Head, A. K.

Publication Information
: 
Amsterdam : Horth-Holland, 1973.

Physical Description
: 
400 s.

Series
: 
Defects in crystalline solids ; v. 7

Series Title
: 
Defects in crystalline solids ; v. 7

Subject Term
: 
ELEKTRONİK VERİ İŞLEM -- ELEKTRON MİKROSKOPİ.
 
ELEKTRONİK VERİ İŞLEM -- MADENLER -- KUSURLAR.

Added Author
: 
Head, A. K.


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Beytepe LibraryBook7.2/12/584870QD 901 D4 1973 C7Beytepe Genel Koleksiyon