Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
by
Klapetek, Petr.
Title
:
Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology.
Author
:
Klapetek, Petr.
ISBN
:
9780128133484
Edition
:
2nd ed.
Physical Description
:
1 online resource (422 pages)
Series
:
Micro and Nano Technologies
Micro & nano technologies.
General Note
:
12.2. Fundamental Phenomena
Subject Term
:
Scanning probe microscopy.
Nanostructures -- Measurement.
Electronic Access
:
| Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
|---|
| Online Library | E-Book | 459965-1001 | ONLINE | | Elektronik Kütüphane |