Test Generation of Crosstalk Delay Faults in VLSI Circuits
by
 
Jayanthy, S. author.

Title
: 
Test Generation of Crosstalk Delay Faults in VLSI Circuits

Author
: 
Jayanthy, S. author.

ISBN
: 
9789811324932

Edition
: 
1st ed. 2019.

Physical Description
: 
XI, 156 p. 49 illus., 7 illus. in color. online resource.

Subject Term
: 
Electronic circuits.
 
Microprogramming .
 
Computer software—Reusability.

Added Author
: 
Bhuvaneswari, M.C.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
https://doi.org/10.1007/978-981-13-2493-2


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book484415-1001ONLINEElektronik Kütüphane