VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
by
 
Sengupta, Anirban. editor.

Title
: 
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers

Author
: 
Sengupta, Anirban. editor.

ISBN
: 
9789813297678

Edition
: 
1st ed. 2019.

Physical Description
: 
XVI, 775 p. 545 illus., 336 illus. in color. online resource.

Series
: 
Communications in Computer and Information Science, 1066

Subject Term
: 
Computer hardware.
 
Computer organization.
 
Artificial intelligence.
 
Optical data processing.
 
Mathematical logic.

Added Author
: 
Sengupta, Anirban.
 
Dasgupta, Sudeb.
 
Singh, Virendra.
 
Sharma, Rohit.
 
Kumar Vishvakarma, Santosh.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
https://doi.org/10.1007/978-981-32-9767-8


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book486687-1001ONLINEElektronik Kütüphane