VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
by
Sengupta, Anirban. editor.
Title
:
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Author
:
Sengupta, Anirban. editor.
ISBN
:
9789813297678
Edition
:
1st ed. 2019.
Physical Description
:
XVI, 775 p. 545 illus., 336 illus. in color. online resource.
Series
:
Communications in Computer and Information Science, 1066
Subject Term
:
Computer hardware.
Computer organization.
Artificial intelligence.
Optical data processing.
Mathematical logic.
Added Author
:
Sengupta, Anirban.
Dasgupta, Sudeb.
Singh, Virendra.
Sharma, Rohit.
Kumar Vishvakarma, Santosh.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 486687-1001 | ONLINE | | Elektronik Kütüphane |