Multi-run Memory Tests for Pattern Sensitive Faults
by
 
Mrozek, Ireneusz. author.

Title
: 
Multi-run Memory Tests for Pattern Sensitive Faults

Author
: 
Mrozek, Ireneusz. author.

ISBN
: 
9783319912042

Edition
: 
1st ed. 2019.

Physical Description
: 
X, 135 p. 34 illus. online resource.

Subject Term
: 
Electronic circuits.
 
Microprocessors.
 
Electronics.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
https://doi.org/10.1007/978-3-319-91204-2


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book487779-1001ONLINEElektronik Kütüphane