Trace-Based Post-Silicon Validation for VLSI Circuits
by
 
Liu, Xiao. author.

Title
: 
Trace-Based Post-Silicon Validation for VLSI Circuits

Author
: 
Liu, Xiao. author.

ISBN
: 
9783319005331

Edition
: 
1st ed. 2014.

Physical Description
: 
XV, 108 p. 59 illus., 38 illus. in color. online resource.

Series
: 
Lecture Notes in Electrical Engineering, 252

Subject Term
: 
Electronic circuits.
 
Microprocessors.
 
Semiconductors.

Added Author
: 
Xu, Qiang.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
https://doi.org/10.1007/978-3-319-00533-1


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book488098-1001ONLINEElektronik Kütüphane