Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
by
Franco, Jacopo. author.
Title
:
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Author
:
Franco, Jacopo. author.
ISBN
:
9789400776630
Edition
:
1st ed. 2014.
Physical Description
:
XIX, 187 p. 219 illus. online resource.
Series
:
Springer Series in Advanced Microelectronics, 47
Subject Term
:
Semiconductors.
Electronic circuits.
Optical materials.
Added Author
:
Kaczer, Ben.
Groeseneken, Guido.
Added Corporate Author
:
SpringerLink (Online service)
Electronic Access
:
Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
---|
Online Library | E-Book | 489246-1001 | ONLINE | | Elektronik Kütüphane |