Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
by
 
Franco, Jacopo. author.

Title
: 
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications

Author
: 
Franco, Jacopo. author.

ISBN
: 
9789400776630

Edition
: 
1st ed. 2014.

Physical Description
: 
XIX, 187 p. 219 illus. online resource.

Series
: 
Springer Series in Advanced Microelectronics, 47

Subject Term
: 
Semiconductors.
 
Electronic circuits.
 
Optical materials.

Added Author
: 
Kaczer, Ben.
 
Groeseneken, Guido.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
https://doi.org/10.1007/978-94-007-7663-0


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book489246-1001ONLINEElektronik Kütüphane