CMOS Test and Evaluation A Physical Perspective
by
 
Bhushan, Manjul. author.

Title
: 
CMOS Test and Evaluation A Physical Perspective

Author
: 
Bhushan, Manjul. author.

ISBN
: 
9781493913497

Edition
: 
1st ed. 2015.

Physical Description
: 
XIII, 424 p. 338 illus. online resource.

Contents
: 
Introduction -- CMOS Circuit Basics -- CMOS Storage Elements and Synchronous Logic -- IDDQ and Power -- Embedded PVT Monitors -- Variability -- Product Chip Test and Characterization -- Reliability, Burn-In and Guardbands -- Data Analysis and Characterization -- CMOS Metrics and Model Evaluation.

Subject Term
: 
Electronics.
 
Electronic circuits.
 
Semiconductors.
 
Security systems.
 
Electronics and Microelectronics, Instrumentation.
 
Electronic Circuits and Systems.
 
Security Science and Technology.

Added Author
: 
Ketchen, Mark B.

Added Corporate Author
: 
SpringerLink (Online service)

Electronic Access
: 
https://doi.org/10.1007/978-1-4939-1349-7


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book530329-1001ONLINEElektronik Kütüphane