Testing for small-delay defects in nanoscale CMOS integrated circuits
by
Goel, Sandeep K, editor of compilation.
Title
:
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author
:
Goel, Sandeep K, editor of compilation.
ISBN
:
9781315217819
9781351825016
9781439829424
Physical Description
:
1 online resource
Series
:
Devices, circuits, and systems
Devices, circuits, and systems.
Contents
:
section 1. Timing-aware ATPG -- section 2. Faster-than-at-speed -- section 3. Alternative methods -- section 4. SDD metrics.
Subject Term
:
Metal oxide semiconductors, Complementary -- Testing.
Added Author
:
Goel, Sandeep K,
Chakrabarty, Krishnendu,
Electronic Access
:
| Library | Material Type | Item Barcode | Shelf Number | [[missing key: search.ChildField.HOLDING]] | Status |
|---|
| Online Library | E-Book | 547467-1001 | TK7871.99 .M44 T43 2014 | | CRC E-Books |