Advanced VLSI design and testability issues
by
 
Tripathi, Suman Lata.

Title
: 
Advanced VLSI design and testability issues

Author
: 
Tripathi, Suman Lata.

ISBN
: 
9781000168174
 
9781003083436
 
9781000168150
 
9781000168167

Publication Information
: 
Boca Raton, FL : CRC Press, 2020.

Physical Description
: 
1 online resource.

Subject Term
: 
TECHNOLOGY / Electricity
 
TECHNOLOGY / Electronics / Circuits / General
 
Integrated circuits -- Very large scale integration -- Design and construction.

Added Author
: 
Tripathi, Suman Lata.
 
Saxena, Sobhit.
 
Mohapatra, Sushanta Kumar.

Electronic Access
: 
Taylor & Francis https://www.taylorfrancis.com/books/9781003083436
 
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book560458-1001TK7874.75Taylor Fransic E-Kitap Koleksiyonu