MOS interface physics, process and characterization
by
 
Wang, Shengkai, 1984- author.

Title
: 
MOS interface physics, process and characterization

Author
: 
Wang, Shengkai, 1984- author.

ISBN
: 
9781000455762
 
9781003216285
 
9781000455748

Edition
: 
First edition.

Physical Description
: 
1 online resource

Subject Term
: 
Metal oxide semiconductors -- Design and construction -- Mathematics.
 
Semiconductors -- Junctions.
 
Integrated circuits -- Research.
 
Solid state physics -- Experiments.
 
TECHNOLOGY / General
 
TECHNOLOGY / Electronics / General
 
TECHNOLOGY / Electronics / Microelectronics

Added Author
: 
Wang, Xiaolei, 1985-

Electronic Access
: 
Taylor & Francis https://www.taylorfrancis.com/books/9781003216285
 
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book587726-1001TK7871.99 .M44Taylor Fransic E-Kitap Koleksiyonu