An introduction to surface analysis by XPS and AES
by
 
Watts, John F., author.

Title
An introduction to surface analysis by XPS and AES

Author
Watts, John F., author.

ISBN
9781119417644
 
9781119417620
 
9781119417651

Edition
Second edition.

Physical Description
1 online resource : illustrations

Abstract
"This accessible second edition of the bestselling book, An Introduction to Surface Analysis by XPS and AES, 2nd Edition explores the basic principles and applications of X-ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) techniques. It starts with an examination of the basic concepts of electron spectroscopy and electron spectrometer design, followed by a qualitative and quantitative interpretation of the electron spectrum."-- Provided by publisher
 
"The year of publication (2019) is the Golden Jubilee of the launch of XPS and AES as commercially available analysis methods. It is a rather salutary though that both of us have been involved with applied surface analysis for more than three quarters of this time, which gives us both cause to reflect on the many innovations that have taken place during this time. As a celebration of 50 years of XPS we include images of one of the first commercial XPS systems and a sectioned analyser from such a system, overleaf"-- Provided by publisher

Local Note
John Wiley and Sons

Subject Term
Surfaces (Technology) -- Analysis.
 
Electron spectroscopy.
 
Photoelectron spectroscopy.
 
Auger effect.
 
Photoelectron Spectroscopy
 
Surfaces (Technologie) -- Analyse.
 
Spectroscopie électronique.
 
Spectroscopie de photoélectrons.
 
Effet Auger.
 
Auger effect
 
Electron spectroscopy
 
Surfaces (Technology) -- Analysis

Added Author
Wolstenholme, John,

Electronic Access
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119417651


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book595347-1001TP156 .S95Wiley E-Kitap Koleksiyonu