Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method
by
 
Dahoo, Pierre Richard, author.

Title
: 
Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method

Author
: 
Dahoo, Pierre Richard, author.

ISBN
: 
9781119818984

Physical Description
: 
1 online resource

Series
: 
Reliability of Multiphysical Systems Set ; Volume 10
 
Reliability of multiphysical systems set ; v. 10.

Contents
: 
Measurement Systems Using Polarized Light -- Quantum-scale Interaction -- Quantum Optics and Quantum Computers -- Reliability-based Design Optimization of Structures -- Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics

Local Note
: 
John Wiley and Sons

Subject Term
: 
Metrology.
 
Métrologie.
 
Metrology

Added Author
: 
Pougnet, Philippe,
 
El Hami, Abdelkhalak,

Electronic Access
: 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119818984


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book596749-1001QC88Wiley E-Kitap Koleksiyonu