VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
by
 
Shin, Youngsoo. editor.

Title
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers

Author
Shin, Youngsoo. editor.

ISBN
9783319460970

Edition
1st ed. 2016.

Physical Description
XIII, 223 p. 121 illus. online resource.

Series
IFIP Advances in Information and Communication Technology, 483

Abstract
This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.

Subject Term
Computer engineering.
 
Computer networks .
 
Computers.
 
Computer-aided engineering.
 
Electronic circuits.
 
Computer Engineering and Networks.
 
Computer Hardware.
 
Computer-Aided Engineering (CAD, CAE) and Design.
 
Electronic Circuits and Systems.

Added Author
Shin, Youngsoo.
 
Tsui, Chi Ying.
 
Kim, Jae-Joon.
 
Choi, Kiyoung.
 
Reis, Ricardo.

Added Corporate Author
SpringerLink (Online service)

Electronic Access
https://doi.org/10.1007/978-3-319-46097-0


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book618293-1001ONLINESpringer E-Kitap Koleksiyonu