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Physical measurement and analysis of thin films

by

Eastern Analytical Symposium (1967 : New York).

Title

:

Physical measurement and analysis of thin films

Author

:

Eastern Analytical Symposium (1967 : New York).

Conference Author

:

Eastern Analytical Symposium (1967 : New York).

Publication Information

:

New York : Plenum, 1969.

Physical Description

:

xi, 194 s. : res.

Series

:

Progress in analytical chemistry ; v.2

Series Title

:

Progress in analytical chemistry ; v.2

Subject Term

:

İNCE FİLİMLER.

Added Author

:

Murt, E. M., ed.

Guldner, W. G., ed.

Library	Material Type	Item Barcode	Shelf Number	[[missing key: search.ChildField.HOLDING]]	Status
Beytepe Library	Book	7.2/12/448946	QC 176 E2 1967		Beytepe Genel Koleksiyon