Reliability wearout mechanisms in advanced CMOS technologies
by
 
Strong, Alvin Wayne, 1946-

Title
: 
Reliability wearout mechanisms in advanced CMOS technologies

Author
: 
Strong, Alvin Wayne, 1946-

ISBN
: 
9780470455265
 
9780470455258

Publication Information
: 
Piscataway, NJ : IEEE Press ; Hoboken, NJ : Wiley, c2009.

Physical Description
: 
1 online resource (xv, 624 p.) : ill.

Series
: 
IEEE Press series on microelectronic systems
 
IEEE Press series on microelectronic systems.

Subject Term
: 
Metal oxide semiconductors, Complementary -- Reliability.
 
TECHNOLOGY & ENGINEERING -- Electronics -- Microelectronics.
 
TECHNOLOGY & ENGINEERING -- Electronics -- Digital.
 
CMOS-Schaltung.
 
Schaltungsentwurf.

Genre
: 
Electronic books.

Added Author
: 
Strong, Alvin Wayne, 1946-

Electronic Access
: 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029


LibraryMaterial TypeItem BarcodeShelf Number[[missing key: search.ChildField.HOLDING]]Status
Online LibraryE-Book249574-1001ONLINEElektronik Kütüphane