Skip to:
Search Results
|
Content
|
Bottom
|
Search Facets
Log In
|
My Account
|
My Lists
|
|
Remember to clear the cache and close the browser window.
Search Limit
Everything
E-Book
Journals
Beytepe Library
Health Sciences Library
Conservatory Library
Law Library
Social Sciences Vocational High School
DVD Collection
Prof.Dr. Onur Bilge Kula Collection
Rooms Restriction Values
All Fields
Title
Author
Subject
ISBN
ISSN
16
Search Field
All Fields
Target Value
Limit Value
Restriction Value
Search For:
Advanced Search
Limit Search Results
Author
Include
Exclude
Balter, Stephen, ed.
(1)
Bowen, D. Keith (David Keith), 1940-
(1)
Tanner, B. K. (Brian Keith)
(1)
Language
Include
Exclude
English
(2)
Publication Date
Include
Exclude
-
2001
(1)
2006
(1)
Subject
Include
Exclude
2
(1)
FLOROSKOPİ
(1)
FLOROSKOPİ -- STANDARTLAR.
(1)
Fluoroscopy -- standards.
(1)
Fluoroscopy.
(1)
Fluroscopy.
(1)
Integrated circuits -- Measurement.
(1)
Radiology, Interventional -- standards.
(1)
Radiology, Interventional.
(1)
Semiconductor wafers -- Inspection.
(1)
Semiconductors -- Design and construction -- Quality control.
(1)
X-rays -- Diffraction.
(1)
More
View All
Fewer
Collapse All
Material Type
Include
Exclude
Book
E-Book
Shelf Location
Include
Exclude
Electronic Library
Sağlık Bilimleri Genel Koleksiyon
Library
Include
Exclude
Health Sciences Library
Online Library
false
{sortLabel}
{alphabetical}
{relevance}
{include}
{exclude}
{facetName}
{results}
{displayName}
{count}
{error}
Select an Action
Place Hold(s)
Add to My Lists
Email
Print
2 Results Found
1
Sort By:
Relevance (Default)
Publication Date (Ascending)
Publication Date (Descending)
Title
Author
00
DEFAULT
Select a list
Temporary List
Make this your default list.
The following items were successfully added.
There was an error while adding the following items. Please try again.
One or more items could not be added because you are not logged in.
1.
Interventional fluroscopy : physics, technology, safety
Interventional fluroscopy : physics, technology, safety
Author
Balter, Stephen, ed.
Preferred Shelf Number
WN 220 I61 2001
Format:
Availability
Health Sciences Library~1
Available:
Copies:
2.
X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author
Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)
Preferred Shelf Number
ONLINE
Electronic Access
Distributed by publisher. Purchase or institutional license may be required for access.
Format:
Availability
Online Library~1
Available:
Copies:
Select an Action
Place Hold(s)
Add to My Lists
Email
Print
1
Go to:
Search Results
|
Top of Page
|
Search Facets