Search Results for Integrated circuits--Testing.

1.

Testing of Interposer-Based 2.5D Integrated Circuits

Author

Wang, Ran. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-319-54714-5

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2.

Testing for small-delay defects in nanoscale CMOS integrated circuits

Author

Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.

Preferred Shelf Number

TK7871.99 .M44 T43 2014

Electronic Access

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3.

GaN power devices for efficient power conversion

Author

Lidow, Alex, author.

Preferred Shelf Number

TK7871.95 .L53 2025

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980

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4.

Emerging VLSI Devices, Circuits and Architectures Proceedings of the 27th International Symposium, VDAT 2023

Author

Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-981-97-5269-0

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5.

VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023

Author

Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-981-97-3756-7

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6.

Direct Conversion Semiconductor Radiation Detectors using Si, CdTe and CdZnTe

Author

Iniewski, Krzysztof Kris. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-031-94005-7

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7.

Nanometer CMOS ICs From Basics to ASICs

Author

Veendrick, Harry. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-031-64249-4

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8.

Flexible electronic packaging and encapsulation technology

Author

Meng, Hong, editor. Huang, Wei, editor.

Preferred Shelf Number

TK7870.15 .F54 2024

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527845729

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9.

Practical ESD protection design

Author

Wang, Albert Z. H., 1962- author.

Preferred Shelf Number

TK7874

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434

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10.

Semiconductor basics : a qualitative, non-mathematical explanation of how semiconductors work and how they are used

Author

Domingo, George, 1937- author.

Preferred Shelf Number

TK7871.85 .D66 2020

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119597124

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11.

Handbook of 3D integration. Volume 4, Design, test, and thermal management

Author

Franzon, Paul D., editor. Marinissen, Eric Jan, editor. Bakir, Muhannad S., editor.

Preferred Shelf Number

TK7874.893 .H36 2019

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052

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12.

Electronics, power electronics, optoelectronics, microwaves, electromagnetics, and radar

Author

Dorf, Richard C., author Dorf, Richard C., editor.

Preferred Shelf Number

TK145

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9781315222158
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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13.

Nanoelectronics : materials, devices, applications

Author

Puers, R., editor.

Preferred Shelf Number

TK7874.84

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800728

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14.

Nanometer CMOS ICs From Basics to ASICs

Author

J.M. Veendrick, Harry. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-319-47597-4

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15.

Design of 3D integrated circuits and systems

Author

Sharma, Rohit, editor.

Preferred Shelf Number

TK7874.893 .D48 2014

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16.

3D IC stacking technology

Author

Wu, Banqiu. Kumar, Ajay. Ramaswami, Sesh.

Preferred Shelf Number

ONLINE

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Subscription required

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17.

ESD failure mechanisms and models

Author

Voldman, Steven H. Wiley InterScience (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

John Wiley http://dx.doi.org/10.1002/9780470747254
http://site.ebrary.com/lib/alltitles/Doc?id=10317806

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18.

Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approach

Author

Yichuang Sun, ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS019E

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19.

RF measurements for cellular phones and wireless data systems

Author

Scott, Allan W. Frobenius, Rex.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361014

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20.

Digital design and fabrication

Author

Oklobdzija, Vojin G.

Preferred Shelf Number

TK7885 .D54 2008

Electronic Access

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21.

System-on-chip test architectures nanometer design for testability

Author

Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780123739735

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22.

Digital integrated circuits : design-for-test using Simulink and Stateflow

Author

Perelroyzen, Evgeni.

Preferred Shelf Number

TK7874 .P445 2007

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23.

The VLSI handbook

Author

Chen, Wai-Kai, 1936-

Preferred Shelf Number

TK7874.75 .V573 2007

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24.

VLSI test principles and architectures design for testability

Author

Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780123705976

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25.

Embedded systems handbook

Author

Zurawski, Richard.

Preferred Shelf Number

TK7895 .E42 E64 2006

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26.

Microelectronics

Author

Whitaker, Jerry C.

Preferred Shelf Number

TK7874 .M4587 2006

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27.

The Computer Engineering Handbook.

Author

Oklobdzija, Vojin G., author. CRC Press LLC.

Preferred Shelf Number

TK7885 .C645 2002

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9781420041545
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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28.

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Author

Bushnell, Michael L. (Michael Lee), 1950- Agrawal, Vishwani D., 1943-

Preferred Shelf Number

TK7874.75 B87 2000

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29.

Integrated circuit manufacturability the art of process and design integration

Author

Pineda de Gyvez, José. Pradhan, Dhiraj K. IEEE Circuits and Systems Society.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5265097

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30.

VLSI Testing Digital and mixed analogue/digital techniques

Author

Hurst, Stanley L.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS009E

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31.

Low-power HF Microelectronics A unified approach

Author

Machado, Gerson A. S., ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS008E

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32.

Principles of semiconductor network testing

Author

Afshar, Amir.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780750694728

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33.

Algorithmic and Knowledge-based CAD for VLSI

Author

Taylor, Gaynor, ed. Russell, Gordon, ed.

Preferred Shelf Number

ONLINE

Electronic Access

http://dx.doi.org/10.1049/PBCS004E

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34.

Digital circuit testing a guide to DFT and other techniques

Author

Wang, Francis C.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780127345802

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35.

Digital systems testing and testable design

Author

Abramovici, Miron. Breuer, Melvin A. Friedman, Arthur D.

Preferred Shelf Number

ONLINE

Electronic Access

IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5266057

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36.

Electronics reliability and measurement technology nondestructive evaluation

Author

Heyman, Joseph S.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780815511717

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